Chemical force microscopy

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The Chemical force microscopy ( english Chemical force microscopy ; abbreviation CFM ) is a variation of 1986 by Gerd Binnig , Calvin Quate and Christoph Gerber developed atomic force microscope (Atomic Force Microscope, AFM) for mechanically and chemically sensitive imaging of surfaces at the nanometer scale . Instead of a classic AFM tip, a chemically uniformly modified probe tip is used for imaging. When an imaging medium, for example water or hexadecane, is used at the same time, only very specific interactions occur between the tip and the surface, which results in the high chemical specificity of the imaging. The chemical sensitivity with simultaneous high resolution makes chemical force microscopy a unique tool for surface research with great development potential.

literature

  • Sabri Akari: The Colors of Molecules: Chemical Force Microscopy Enables a New Look on Surfaces . In: GIT Imaging & Microscopy . No. 1 , 2006 ( nanocraft.de [PDF; 1.7 MB ]).