Information for "Automatic test pattern generation"

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Display titleAutomatic test pattern generation
Default sort keyAutomatic test pattern generation
Page length (in bytes)12,952
Namespace ID0
Page ID374448
Page content languageen - English
Page content modelwikitext
Indexing by robotsAllowed
Number of page watchers30
Number of page watchers who visited in the last 30 days3
Number of redirects to this page4
Counted as a content pageYes
Wikidata item IDQ837455
Central descriptionelectronic design automation method/technology used to find a test sequence
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Page creatorColin Marquardt (talk | contribs)
Date of page creation13:53, 21 November 2003
Latest editorVissel0126 (talk | contribs)
Date of latest edit05:07, 30 April 2024
Total number of edits164
Recent number of edits (within past 30 days)2
Recent number of distinct authors1

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