Device Under Test

As a Device Under Test ( dt. : DUT ), short DUT , is mainly in the electrical measurement and testing technology , a designated object to be inspected. This can be an isolated area on a wafer , a single component , an assembly or a complete device .

Which functions of the DUT are tested depends on its type, the test parameters or measured values ​​to be determined and the test equipment and measuring devices available.

Can also be referred to as Equipment Under Test ( EUT ), which is often more common in test reports.

See also

• Automatic Test Equipment (ATE)
• Measurement object (MO)