Device Under Test
As a Device Under Test ( dt. : DUT ), short DUT , is mainly in the electrical measurement and testing technology , a designated object to be inspected. This can be an isolated area on a wafer , a single component , an assembly or a complete device .
Which functions of the DUT are tested depends on its type, the test parameters or measured values to be determined and the test equipment and measuring devices available.
Can also be referred to as Equipment Under Test ( EUT ), which is often more common in test reports.
See also
- Automatic Test Equipment (ATE)
- Measurement object (MO)