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Isidor Sauers (born 1948) is an Austrian-born American who is a physicist at the Oak Ridge National Laboratory in Tennessee. He is a specialist on the properties of Sulfur hexafluoride (SF₆), with an important patent and over 60 peer-reviewed academic papers.

Papers

His most notable paper, "Electron Attachment to the perfluoroalkanes" in Journal of Chemical Physics 78 (12) 7200-7216 has been cited 88 times since its publication in 1983. ^[1]

Patent

In the early 1980s, Sauers developed a novel method by which to measure the degradation of Sulfur hexafluoride (SF₆) in high-voltage systems. SF₆, a hypervalent molecule, is used as a gaseous insulator in conjunction with solid insulating material in high voltage systems such as transmission lines, substations and switchgear. When the dielectric strength of SF₆ is exceeded, regions of high electrical stress can cause nearby gas to partially ionize and begin conducting, forming toxic products like SOF₂ or S₂F₁₀. This method allows scientists to detect the toxic by-products of SF₆ breakdown at very low concentrations (ppb) using an ion-molecule reaction cell and a negative ion mass spectrometer, as opposed to conventional methods such as electron impact mass spectrometry (MS), gas chromatography (GC) with thermal conductivity detection, gas chromatography with electron capture detection, or a combination of gas chromatography and mass spectrometry.

References

US Patent 4,633,082 - Process for measuring degradation of sulfur hexafluoride in high voltage systems

^ Journal Citation Reports

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[1] Journal Citation Reports

[1]

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-'''Isidor Sauers''' (born [[1948]]) is an [[Austria]]n-born [[United States|American]] who is  a [[physicist]] at the [[Oak Ridge National Laboratory]] in [[Tennessee]]. He is a specialist on the properties of [[Sulfur hexafluoride]] (SF<sub>6</sub>), with an important patent and over 60 peer-reviewed academic papers.
+'''Isidor Sauers''' (born 1948) is an [[Austria]]n-born [[United States|American]] who is  a [[physicist]] at the [[Oak Ridge National Laboratory]] in [[Tennessee]]. He is a specialist on the properties of [[Sulfur hexafluoride]] (SF<sub>6</sub>), with an important patent and over 60 peer-reviewed academic papers.
 ==Papers==
 His most notable paper, "Electron Attachment to the perfluoroalkanes" in [[Journal of Chemical Physics]] 78 (12) 7200-7216 has been cited 88 times since its publication in 1983. <ref>Journal Citation Reports</ref>
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 ==Patent==
 [[Image:Circuit Breaker 115 kV.jpg|right|thumb|233px|A [[high-voltage]] circuit breaker mounted outdoors at the [[substation]] near the Manitoba Hydro Slave Falls generating station. The horizontal cylindrical tanks contain the interrupters which operate in an envelope filled with [[Sulfur hexafluoride|SF<sub>6</sub>]] gas.]]
-In the early [[1980s]], Sauers developed a [[novelty (patent)|novel]] method by which to measure the [[Chemical decomposition|degradation]] of [[Sulfur hexafluoride]] (SF<sub>6</sub>) in [[high-voltage]] systems. [[Sulfur hexafluoride|SF<sub>6</sub>]], a [[hypervalent molecule]], is used as a gaseous [[Electrical insulation|insulator]] in conjunction with solid insulating material in high voltage systems such as [[transmission lines]], [[substation]]s and [[switchgear]]. When the [[dielectric strength]] of SF<sub>6</sub> is exceeded, regions of high electrical stress can cause nearby gas to partially [[ionize]] and begin conducting, forming [[toxic]] products like SOF<sub>2</sub> or [[Disulfur decafluoride|S<sub>2</sub>F<sub>10</sub>]]. This method allows scientists to detect the toxic by-products of SF<sub>6</sub> breakdown at very low concentrations ([[ppb]]) using an ion-molecule reaction cell and a negative ion [[mass spectrometer]], as opposed to conventional methods such as electron impact [[mass spectrometry]] (MS), [[gas chromatography]] (GC) with thermal conductivity detection, gas chromatography with [[electron capture]] detection, or a combination of gas chromatography and mass spectrometry.
+In the early 1980s, Sauers developed a [[novelty (patent)|novel]] method by which to measure the [[Chemical decomposition|degradation]] of [[Sulfur hexafluoride]] (SF<sub>6</sub>) in [[high-voltage]] systems. [[Sulfur hexafluoride|SF<sub>6</sub>]], a [[hypervalent molecule]], is used as a gaseous [[Electrical insulation|insulator]] in conjunction with solid insulating material in high voltage systems such as [[transmission lines]], [[substation]]s and [[switchgear]]. When the [[dielectric strength]] of SF<sub>6</sub> is exceeded, regions of high electrical stress can cause nearby gas to partially [[ionize]] and begin conducting, forming [[toxic]] products like SOF<sub>2</sub> or [[Disulfur decafluoride|S<sub>2</sub>F<sub>10</sub>]]. This method allows scientists to detect the toxic by-products of SF<sub>6</sub> breakdown at very low concentrations ([[ppb]]) using an ion-molecule reaction cell and a negative ion [[mass spectrometer]], as opposed to conventional methods such as electron impact [[mass spectrometry]] (MS), [[gas chromatography]] (GC) with thermal conductivity detection, gas chromatography with [[electron capture]] detection, or a combination of gas chromatography and mass spectrometry.
 ==See also==