Isidor Sauers: Difference between revisions
Pegasusbot (talk | contribs) template substitution using AWB |
m →Papers: replaced: Journal of Chemical Physics → ''Journal of Chemical Physics'' |
||
(45 intermediate revisions by 38 users not shown) | |||
Line 1: | Line 1: | ||
{{short description|Austrian-born American (born 1948)}} |
|||
'''Isidor Sauers''', a naturalized [[American]] citizen born in [[Austria]] in [[1948]], is a [[physicist]] at the [[Oak Ridge National Laboratory]] in [[Tennessee]]. |
|||
'''Isidor Sauers''' (born 1948) is an [[Austria]]n-born [[United States|American]] who is a [[physicist]] at the [[Oak Ridge National Laboratory]] in [[Tennessee]]. He is a specialist on the properties of [[Sulfur hexafluoride]] (SF<sub>6</sub>), with an important patent and over 60 peer-reviewed academic papers. |
|||
== |
==Papers== |
||
His most notable paper, "Electron Attachment to the perfluoroalkanes" in ''[[Journal of Chemical Physics]]'' 78 (12) 7200-7216 has been cited 88 times since its publication in 1983.<ref>Journal Citation Reports</ref> |
|||
==Patent== |
|||
⚫ | |||
[[Image:Circuit Breaker 115 kV.jpg|right|thumb|233px|A [[high-voltage]] circuit breaker mounted outdoors at the [[Electrical substation|substation]] near the Manitoba Hydro Slave Falls generating station. The horizontal cylindrical tanks contain the interrupters which operate in an envelope filled with [[Sulfur hexafluoride|SF<sub>6</sub>]] gas.]] |
|||
⚫ | In the early 1980s, Sauers developed a [[novelty (patent)|novel]] method by which to measure the [[Chemical decomposition|degradation]] of [[Sulfur hexafluoride]] (SF<sub>6</sub>) in [[high-voltage]] systems. [[Sulfur hexafluoride|SF<sub>6</sub>]], a [[hypervalent molecule]], is used as a gaseous [[Electrical insulation|insulator]] in conjunction with solid insulating material in high voltage systems such as [[transmission lines]], [[Electrical substation|substations]] and [[switchgear]]. When the [[dielectric strength]] of SF<sub>6</sub> is exceeded, regions of high electrical stress can cause nearby gas to partially [[ionize]] and begin conducting, forming [[toxic]] products like SOF<sub>2</sub> or [[Disulfur decafluoride|S<sub>2</sub>F<sub>10</sub>]]. This method allows scientists to detect the toxic by-products of SF<sub>6</sub> breakdown at very low concentrations ([[Parts per billion|ppb]]) using an ion-molecule reaction cell and a negative ion [[mass spectrometer]], as opposed to conventional methods such as electron impact [[mass spectrometry]] (MS), [[gas chromatography]] (GC) with thermal conductivity detection, gas chromatography with [[electron capture]] detection, or a combination of gas chromatography and mass spectrometry. |
||
==See |
==See also== |
||
⚫ | |||
⚫ | |||
⚫ | |||
⚫ | |||
⚫ | |||
*[[Dielectric |
*[[Dielectric constant]] |
||
⚫ | |||
==References== |
==References== |
||
*[http://www.patentgenius.com/patent/4633082.html US Patent 4,633,082 - Process for measuring degradation of sulfur hexafluoride in high voltage systems] |
|||
{{reflist}} |
|||
{{Authority control}} |
|||
{{DEFAULTSORT:Sauers, Isidor}} |
|||
⚫ | |||
⚫ | |||
⚫ | |||
⚫ | |||
⚫ | |||
⚫ | |||
*{{US patent|4,633,082}} |
|||
{{physicist-stub}} |
{{US-physicist-stub}} |
||
⚫ | |||
⚫ | |||
⚫ | |||
[[Category:Inventors|Sauers, Isidor]] |
|||
⚫ | |||
⚫ | |||
[[Category:Laboratory techniques]] |
|||
[[Category:Electricity distribution]] |
|||
⚫ |
Latest revision as of 18:36, 30 August 2023
Isidor Sauers (born 1948) is an Austrian-born American who is a physicist at the Oak Ridge National Laboratory in Tennessee. He is a specialist on the properties of Sulfur hexafluoride (SF6), with an important patent and over 60 peer-reviewed academic papers.
Papers[edit]
His most notable paper, "Electron Attachment to the perfluoroalkanes" in Journal of Chemical Physics 78 (12) 7200-7216 has been cited 88 times since its publication in 1983.[1]
Patent[edit]
In the early 1980s, Sauers developed a novel method by which to measure the degradation of Sulfur hexafluoride (SF6) in high-voltage systems. SF6, a hypervalent molecule, is used as a gaseous insulator in conjunction with solid insulating material in high voltage systems such as transmission lines, substations and switchgear. When the dielectric strength of SF6 is exceeded, regions of high electrical stress can cause nearby gas to partially ionize and begin conducting, forming toxic products like SOF2 or S2F10. This method allows scientists to detect the toxic by-products of SF6 breakdown at very low concentrations (ppb) using an ion-molecule reaction cell and a negative ion mass spectrometer, as opposed to conventional methods such as electron impact mass spectrometry (MS), gas chromatography (GC) with thermal conductivity detection, gas chromatography with electron capture detection, or a combination of gas chromatography and mass spectrometry.
See also[edit]
- Circuit breaker
- International Electrotechnical Commission (IEC)
- Dielectric strength
- Dielectric constant
References[edit]
- ^ Journal Citation Reports