Built-in self-test

Built-in self-test (BIST) means that an electronic component has an integrated test circuit which generates test signals and usually also compares them with specified correct response signals so that the test result can be output to an ATE ( Automatic Test Equipment ). Built in self tests are becoming easier to implement thanks to automated design processes and take up relatively little space with today's large number of switching elements, but they significantly reduce the material and time required for testing . They are also used for the regular self-test of processors while they are in use or when they are switched on or off, in order to detect malfunctions in good time and avoid consequential damage.

There are different types of built in self tests:

• Analog and mixed signal BIST
• Boundary Scan Test
• Logic BIST
• Processor BIST
• Signature analysis
• Storage BIST - e.g. B. with the Marinescu algorithm

Web links

• Brian Harrington: BIST for Analog Weenies on analog.com