HTOL
HTOL ( High Temperature Operating Life ) is a reliability test in semiconductor and microelectronics . The semiconductor components and circuits are exposed to higher voltages and higher temperatures during the test.
Sometimes HTOL is referred to as "Lifetime Test", "Device Life Test" or "Extended Burn in Test".
Individual evidence
- ^ AEC Documents AEC Documents
- ↑ JEDEC standards JEDEC standard
- ↑ Mil standards Mil standard ( Memento of the original from June 24, 2013 in the Internet Archive ) Info: The archive link was inserted automatically and has not yet been checked. Please check the original and archive link according to the instructions and then remove this notice. (PDF; 75 kB)
- ↑ Sematech Handbook Comparing the Effectiveness of Stress-based Reliability Qualification Stress Conditions ( Memento of the original from February 20, 2016 in the Internet Archive ) Info: The archive link was inserted automatically and has not yet been checked. Please check the original and archive link according to the instructions and then remove this notice.
