PIXE

The abbreviation PIXE stands for induced particle X-ray Emission or Proton Induced X-ray Emission ( P article- I nduced X -ray E mission or Proton Induced X-ray Emission ), and is a common method of ion beam analysis.

In the PIXE method, the sample is examined with an ion beam . When passing through the sample, the ions lose energy mainly through interaction with the electron shell. The particles also collide with electrons from the inner shells . This knocks them out of the atomic shell. As a result, the now ionized atoms can be de-excited by characteristic X-rays . This is used in the PIXE method to determine the element concentration.

The method itself is suitable for heavy elements ( ordinal numbers Z> 12… 20) and, compared to other X-ray methods, has a significantly lower bremsstrahlung background . This also makes it possible to analyze trace elements.

For light elements, the competing Auger effect greatly reduces the characteristic X-ray emission. In addition, light atoms emit low-energy X-rays. This is already attenuated to a relatively large extent in front of the detector by foils which, among other things, serve to absorb the backscattered ions and can therefore not be detected or only poorly.

Web links

https://www.pro-physik.de/nachrichten/kompakt-praezise-und-leistungsstark