X-ray spectroscopy

X-ray spectroscopy (XRS) is the generic term for a large number of different spectroscopic measurement methods in physics , the common feature of which is the application of X-rays . Roughly, the part of the electromagnetic spectrum of the X-rays can be further divided into hard X-rays (from approx. 10 keV ) and soft X-rays (below approx. 10 keV):

• X-ray absorption spectroscopy (XAS)
• X-ray emission spectroscopy (XES)
• Photoelectron Spectroscopy (XPS)
• X-ray fluorescence analysis (XRF)
• Energy dispersive X-ray spectroscopy (EDX)
• Wavelength dispersive X-ray spectroscopy (WDX)
• Particle Induced X-ray Spectroscopy (PIXE)

Web links

• ETH Zurich directory of databases and reference works with X-ray spectra

literature

• Douglas A. Skoog, James J. Leary, D. Brendel, S. Hoffstetter-Kuhn: Instrumental Analytics: Fundamentals, Devices, Applications , Springer, 1996, ISBN 9783540604501 , pp. 389-414 .