Thomas W. Williams
Thomas W. Williams (born August 3, 1943 ) is an American engineer and computer scientist.
Williams graduated from Clarkson University with a bachelor's degree in electrical engineering, received a master's degree in mathematics from the State University of New York at Binghamton, and received a doctorate in electrical engineering from Colorado State University . He joined IBM where he became a Senior Technical Staff Member in the microelectronics division of IBM in Boulder , Colorado and manager of the VLSI Design for Testability group. He then became a senior scientist at Synopsis.
He is adjunct professor at the University of Colorado and he was visiting professor at Leibniz University Hannover (1985, 1997 as a Robert Bosch scholarship holder).
In the 1960s he developed new test and design techniques for LSI and then VLSI Design with Edward B. Eichelberger (Level Sensitive Scan Design, LSSD).
In 2018 Williams received the Phil Kaufman Award , in 1989 the W. Wallace McDowell Award with Eichelberger . In 1988 he became a Fellow of the IEEE .
Fonts
- with Eichelberger, E. Lindbloom, JA Waicukauski Structured logic testing , Prentice Hall 1991
Web links
| personal data | |
|---|---|
| SURNAME | Williams, Thomas W. |
| BRIEF DESCRIPTION | American engineer and computer scientist |
| DATE OF BIRTH | August 3, 1943 |