Simultaneous measurement

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Simultaneous (simultaneous) measurements at different positions or with different instruments play a major role in natural sciences and technology . The purpose of such measurements is usually to eliminate sources of error. In detail, this can include:

Simultaneous processes are of particular importance wherever high relative measurement accuracy is required . The higher the accuracy, the more disruptive effects occur. They either have to be rendered harmless or they have to be modeled mathematically and physically.

Geodesy and Astronomy

Nowadays, in the fields of geodesy and astronomy , accuracies of 1: 1 million and more are required. For this reason, a number of simultaneous measurement and determination methods have been developed on the most varied of levels:

Examples from other subject areas

photography

In photography and photogrammetry it is also predominantly measurement of geometrical sizes. Therefore, similar methods as above are in use.

navigation

In navigation : Simultaneous measurement of the transit times of different radio waves - for example with LORAN , Decca and Global Positioning System .

physics

Electrical engineering

In the data transmission , the pliers measurement : Two observe time-synchronized instruments such. B. sending a dial command in the ISDN and at the same time the arrival of the incoming call at the other end. Protocol translation errors can thus be identified.

chemistry

  • Detection of correlations between structure and catalysis.

For example: only changes the electronic structure as soon as the catalysis begins, or the atomic arrangement on the catalyst also changes, e.g. B. partial reduction, expansion of the crystal lattice, pore effects.

  • Measurement of the kinetics as a function of the temperature, partial pressure of the starting materials e.g. B. O 2 , CO etc.
  • Correlations of near and long-range order effects with different methods, since the methods complement each other, e.g. B. Exafs / Xanes to determine the local structure (closest neighbors) and XRD to categorize the crystal system (long-range order effects, superstructures, statistical or ordered distribution of defects, vacancies, etc.)