Boundary Scan Description Language
The Boundary Scan Description Language ( BSDL for short ) is a language for describing the boundary scan test capabilities of JTAG -compatible electronic components. The boundary scan test is a test procedure for electronic components with which defective component pins or defective connections on a circuit board can be determined. Originally defined in 1149.1b-1994 “Supplement to IEEE Std 1149.1-1990, IEEE standard test access port and boundary-scan architecture”, BSDL is now part of 1149.1-2001 “IEEE standard test access port and boundary-scan architecture”.
BSDL based on a simplified VHDL - language syntax to describe, through which boundary scan test capabilities an electrical component features. This description is provided by the manufacturers as a .bsdl file. These files are used by boundary scan tools to generate test programs for boundary scan tests at component or board level, or they are used for hardware fault diagnosis .
A BSDL file contains a list of all boundary scan cells present in the module and describes how they are connected to the module pins, what function they have and how they can be used in a boundary scan test. The BSDL file also contains the JTAG commands supported by the block and their OpCodes . Often it also contains information about special features to be observed when using the JTAG port. These can be special reset conditions , for example .
Web links
A Language for Describing Boundary-Scan Devices ( Memento from September 5, 2008 in the Internet Archive ) - The paper in which BSDL was proposed
Individual evidence
- ↑ BSDL Tutorial ( en ) Corelis Education.