EN ISO 25178

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Logo of the German Institute for Standardization DIN EN ISO 25178
Area Geometrical product specification (GPS)
title Surface quality: flat
Brief description: see text
Latest edition 2010-2018
ISO 25178

The DIN EN ISO 25178 series of standards deals with surface roughness measurement . This allows a large number of new evaluations to better describe the functions of the surface.

This standard was drawn up by the Technical Committee TC213 of the WG16 working group of ISO .

It is the first international standard to take into account the measurement and specification of 3D surface textures. In detail, the standard defines 3D texture parameters and the associated operators for their determination. It also describes the applicable measurement technology, calibration methods and physical calibration standards, as well as the calibration software required for this.

A fundamentally new component of the standard is the coverage of non-contact measurement methods, which are already widespread in industry, but which previously lacked a standard to carry out quality audits according to EN ISO 9001 . For the first time, the standard introduces 3D surface characterization in areas in which 2D profilometers have been standardized by standards for over 30 years. The same applies to the associated surface metrology, which is not limited to mechanical scanning processes, but also includes confocal microscopes or interferometers .

DIN EN ISO 25178 - parts

This standard is divided into the following parts:

  • Part 1: Specification of surface properties (as of December 2016)
  • Part 2: Terms and surface parameters (as of September 2012)
  • Part 3: Specification operators (deals with the default settings of the filters, as of November 2012)
  • Part 6: Classification of methods for measuring surface quality (as of June 2010)
  • Part 70: Measuring standards (as of June 2014)
  • Part 71: Software standards (as of January 2018)
  • Part 72: XML file format x3p ​​(definition of the XML file format x3p ​​for storage and exchange of profile and topography data, as of November 2017)
  • Part 600: (Draft) Metrological features for surface topographical measurement methods (Draft from June 2017)
  • Part 601: Features of contact measuring devices (with button) (as of January 2011)
  • Part 602: Features of non-contact measuring devices (with chromatic confocal probe ) (January 2011)
  • Part 603: Features of non-contact measuring devices (phase-shifting interferometric microscopy ) (February 2014)
  • Part 604: Features of non-contact measuring devices ( white light interferometry ) (as of December 2013)
  • Part 605: Features of non-contact measuring devices (point autofocus sensor) (as of June 2014)
  • Part 606: Features of non-contact measuring devices ( focus variation ) (as of December 2016)
  • Part 607: Features of non-contact measuring devices ( confocal microscopes ) (as of March 2019)
  • Part 701: Calibration and standards for contact measuring devices (with button) (January 2011)

Parameters in EN ISO 25178-2

This part deals with the possible parameters. These include:

  • Height parameters
  • Spatial parameters
  • Hybrid parameters
  • Functions and related parameters
  • Mixing parameters

Methods in EN ISO 25178-6

Part 6 of the series of standards deals with the available methods for measuring roughness, e.g. B.

  • Focus varying microscopy

Roughness value S a

EN ISO 25178 defines the surface-related roughness value using the arithmetic mean :

where is the considered surface and the profile height. The profile height and its integral are measured using the methods mentioned above.

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