Journal of Applied Crystallography

from Wikipedia, the free encyclopedia
Journal of Applied Crystallography

description Scientific journal
Area of ​​Expertise Applied crystallography
language English, French, Russian
publishing company Wiley-Blackwell
First edition 1968
Frequency of publication Bi-monthly
Impact Factor 2,995 (2019)
Editor-in-chief AJ Allen
editor International Union of Crystallography
Web link journals.iucr.org/j/
Article archive journals.iucr.org/j/services/archive.html
ISSN (print)
CODEN JACGAR

The Journal of Applied Crystallography (abbreviated .. J. Appl Crystallogr ) is in the peer-reviewed published procedure scientific journal of the International Union of Crystallography , which at Wiley-Blackwell appears. It was first published in 1968 and deals with the application of crystallography and crystallographic techniques. The Journal of Applied Crystallography publishes articles on crystallographic methods used to study crystalline and non-crystalline materials using neutrons , X-rays and electrons , their application in condensed matter research , materials science and life sciences , as well as their use for the identification of phase transitions and structural changes, lattice defects , structure-property relationships, interfaces and surfaces. In addition, the development of crystallographic instruments and apparatus, theories and interpretations, numerical analyzes and computer programs for crystallography are reported.

The journal is indexed by Chemistry Citation Index , Ceramic Abstracts , Chemical Abstracts Service , Cambridge Structural Database , Current Contents , Inorganic Crystal Structure Database , Inspec , Metals Abstracts , Materials Science Citation Index , Reaction Citation Index , Science Citation Index, and Scopus .

Individual evidence

  1. about Journal of Applied Crystallography. In: journals.iucr.org. Retrieved July 24, 2020 .
  2. ^ G. Kostorz: A new format and overall appearance for Journal of Applied Crystallography . In: Journal of Applied Crystallography . 33, 2000, p. 1. doi : 10.1107 / S0021889800000200 .