PANalytical

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PANalytical
legal form	BV (GmbH)
founding	2002
Seat	Almelo , Netherlands
management	Peter van Velzen
Number of employees	1000
Website	www.panalytical.de

PANalytical is a Dutch manufacturer of X-ray analysis devices in the field of X-ray diffractometry (XRD) and X-ray fluorescence spectroscopy (XRF). The company has been developing and producing X-ray diffractometers and X-ray fluorescence spectrometers for research, development and production control since 1954 . The X-ray systems are used in material and structural analysis as well as in quality assurance. The products are used in the analysis of cement, metals, steel, plastics, polymers, pharmaceutical and petrochemical products, industrial minerals, glass, catalysts, semiconductor materials, thin films and new materials, recycling and environmental materials.

PANalytical employs around 1000 people worldwide. Own research, development and production facilities are located in the Netherlands, Japan and the USA . It has its own sales and service structures in more than 60 countries. PANalytical GmbH, responsible for sales and service in Germany, is based in Kassel .

Until it was sold in 2002, PANalytical was a division of Philips under the name Philips Analytical . The company is now part of Spectris plc. based in England .

In 2011 PANalytical entered into a strategic partnership with the EADS subsidiary Sodern (Limeil-Brevannes, France), a manufacturer of neutron activation analyzers. The CNA systems ( Controlled Neutron Activation ) are used for online control of mass flows. The element content of the materials (e.g. limestone) is measured directly on the conveyor belt from the quarry to further processing, thus recording the total amount of material flow.

In 2012, Analytical Spectral Devices (ASD Inc.), a manufacturer of high-performance analytical NIR systems, was acquired. ASD develops, produces and markets NIR measurement systems and applications for industry and research.

history

• In 1931, Philips brought the first commercially available X-ray machine called Metalix onto the market.
• In 1948, the North American Philips corporation Norelco introduced the first X-ray diffractometer in collaboration with the US Naval Research Laboratories.
• In 1954, Philips Analytical introduced the PW1520-XRF spectrometer, which pioneered commercial fluorescence products for elemental analysis. In the same year Philips introduced the PW1050 goniometer (θ-2θ geometry) for diffraction.
• In 1972 the head office and development was moved from Eindhoven to Almelo . In the decades that followed, Philips continued to develop the Philips Analytical brand's product portfolio. The mechanical accuracy passed a new milestone with the PW3050 goniometer. DC motor drives with optical encoders ensured an angle reproducibility of 0.0001 °. The company is the only manufacturer to produce its own X-ray tubes and these are also installed by other manufacturers. With the sale to Spectris in 2002, the company parted with smaller activities in the field of optoacoustics and photoluminescence.
• 2011 Strategic partnership with EADS-Sodern in the field of neutron activation
• 2012 Takeover of ASDi, manufacturer of NIR systems

In addition to the systems, the product portfolio also includes software products that are developed and sold in-house.

Products

Spectrometer for X-ray fluorescence analysis (XRF or XRF)

Wavelength dispersive (WDRFA, also WDX ) or energy dispersive (EDRFA, also EDX ) X-ray fluorescence spectrometers are used for element analysis of solid or liquid samples. Here, a sample that is as homogenized as possible is excited by X-rays to emit element-specific fluorescence radiation, which is then resolved and detected in a wavelength-dispersive or energy-dispersive manner. The intensity of the measured fluorescence radiation is proportional to the element concentration. The element composition of a sample can be determined within a short period of time by calibration against suitable standards or without a standard using a fundamental parameter approach.

A large number of different types of X-ray tubes are available, which are manufactured in-house.

Wavelength dispersive sequence spectrometer (WDRFA system)

The technique, which has been developed since the 1930s, uses a so-called mechanical goniometer to separate the element-specific fluorescence radiation, whereby the analyte lines are approached one after the other (sequentially). A complete spectrum can be generated by continuously scanning the gonimeter and recording all measurement points. The advantage of the wavelength dispersive technique lies in the very good resolution for light elements and the correspondingly strong detection.

Axios (WDRFA system)

XRF universal spectrometer for element analysis from sub-ppm to 100% range. The system is used in industry (process and quality control), industrial research and development and in basic research. The Axios is widely used in the steel, cement, mineral, plastic and oil sectors.

Venus (WDRFA system)

Compact sequence spectrometer. Thanks to the special sequential / simultaneous technique, strong evidence and stable. Particularly suitable for the routine analysis of a few elements in incoming product inspection or quality monitoring.

Wavelength dispersive simultaneous spectrometer (WDRFA system)

Simultaneous spectrometers are specially developed for ultra-fast analysis. Highly precise and very fast multi-element analysis is achieved through preset channels (small fixed goniometers) for each component, which are measured simultaneously. Measurement times usually only a few seconds. Additional installation of scanners possible to expand the range of elements. Usually integration into an automation in which the sample preparation takes place automatically.

Axios-Fast (WDRFA system)

The Axios Fast is a powerful simultaneous spectrometer for up to 28 element channels and 3 goniometers. It is characterized by extremely fast sample loading times and high performance. The connection to an automation is possible via belts as well as robots. The main focus of the application is in the metal industry. B. in the areas of steel and copper, but also in mineral applications.

Wafer analyzer (WDRFA system)

Simultaneous X-ray spectrometer specially developed for semiconductor metrology for element and layer thickness analysis on semiconductor materials. Nowadays, the systems are mostly used in so-called in-wall installations, where the employee operates the analysis system in a clean room environment and the wafers are preferably stacked in cassettes and fed to the system.

CubiX XRF (WDRFA system)

Compact and robust simultaneous spectrometer with low X-ray output to minimize the supply requirements. The fluorescence radiation of all elements to be measured is recorded simultaneously by element-specific detectors. The system is mainly used in industry, where process and quality control must be carried out on material flows that are sampled at regular intervals. The system is suitable for measurements on powder tablets that are transported to the spectrometer both manually and fully automatically.

Energy dispersive X-ray spectrometer (EDRFA system)

Development since the 1970s. In contrast to wavelength-dispersive fluorescence analysis, with energy-dispersive technology, the element-specific fluorescence radiation is not separated using a goniometer, but instead is energetically split up directly in the detector (mostly semiconductor detector) and its electronics. A compact structure can thereby be achieved. The resulting intensities per energy range are assigned to the respective elements in a development program. As with the WDRFA, the intensities or counting rates are proportional to the concentration. The advantages here are the low electrical power consumption and the material-friendly analysis.

Epsilon 5 (EDRFA system)

The Epsilon 5 spectrometer has a 100 kV excitation and a high-resolution Ge detector . With the help of secondary targets and a three-dimensional arrangement (polarization), the disturbing background radiation is minimized. With the Epsilon-5 spectrometer, for example, heavy metals in plastics, oils or filters can be detected down to the sub- ppm range. a. used in environmental analysis.

Epsilon 3 (EDRFA system)

The Epsilon 3 extends the series of classic EDRFA systems such as the MiniPal series. It is equipped in various designs with a low-power X-ray tube (9 or 15 W, up to 30 to 50 kV) and a silicon drift detector (SDD) of the latest generation. The Epsilon 3 can be used to analyze powder samples, compacts, liquids, pasty substances and solid samples up to the size of a brick. As a compact tabletop device, it can be transported relatively easily. Particular emphasis was placed on the strength of the detection of light elements (fluorine accessible for the first time).

Semyos spectrometer (EDRFA system)

The Semyos spectrometer has been specially developed for semiconductor metrology and, in addition to classic quantitative element analysis, also enables layer thickness analysis. A special feature is the microspot technology, which allows spot sizes of less than 23 µm. The Semyos spectrometer is suitable for research and development as well as for quality control in production.

X-ray diffractometry (XRD)

In X-ray diffractometry, the structural properties of crystalline matter are investigated on the basis of the Bragg equation . For this purpose, a solid or liquid sample is irradiated with X-rays of a specific wavelength at different angles. The sample diffracts the incident radiation at the existing crystalline structures (network planes or electron density centers) according to the model of the radiation optics and the diffracted beam can be detected on the goniometer circle at the same distance from the X-ray tube. This leads to a specific diffraction pattern with individual reflections, the angular position and intensity of which depends on the crystal structure and thus the phases present.

In addition to the qualitative phase analysis, i. H. the determination of the existing phases, quantitative phase analysis is often the focus of investigations today. With the introduction of the X'Celerator semiconductor detector in 2000, PANalytical revolutionized so-called powder diffractometry . While conventional diffractometers need up to an hour or more to record meaningful data, data with the semiconductor detector are available after just a few minutes. Even shorter measuring times with better resolution are achieved with the new generation of these detectors, the PIXcel. The latest version PIXcel3D even allows 2-dimensional measurements and computed tomographic recordings.

In addition to products for production and quality control of powder samples (CubiX3), PANalytical also offers systems for research and development. With the systems of the X'Pert PRO series, the company implemented a modular concept more than 10 years ago, which enables the adjustment-free conversion of the systems from one to another measuring geometry. The current Empyrean system has further perfected this technology.

• X'Pert Powder (X-ray diffractometer for the analysis of powder samples in reflection and transmission)
• X'Pert PRO MRD (Material Research Diffractometer) (system for the complete analysis of solid samples with options for residual stress analysis, texture analysis, grazing-incident measurements , in-plane geometries, analysis of rocking curves and reciprocal space maps)
• CubiX3 (compact theta-theta diffractometer for industry and standard phase analysis)
• Empyrean (fully modular system with vertical goniometer for performing practically all tasks in the field of X-ray diffraction: phase analysis, small-angle scattering , non-ambient analysis, texture and stress analysis, high-resolution diffraction, reflectometry, tomography)

PANalytical has its own X-ray tube factory near Eindhoven (NL), where not only the X-ray tubes for in-house use are developed and produced, but also those for OEM partners.

Prompt Gamma Neutron Activation Analysis (PGNAA)

This article or the following section is not adequately provided with supporting documents ( e.g. individual evidence ). Information without sufficient evidence could be removed soon. Please help Wikipedia by researching the information and including good evidence.

Under the name “CNA” ( Controlled Neutron Analyzer ), the French company Sodern sells various measuring devices for prompt gamma neutron activation analysis under license from PANanalytical . With this method, the sample material on the conveyor belt is excited by a neutron source and the gamma radiation of the activated material is measured in suitable detectors. The ability of neutrons to interact with deeper layers of the sample enables the direct detection of larger mass flows. In addition to the cement industry ("CNA Cement"), the main areas of application for the CNA devices are nickel, copper and iron ore mining and coal analysis in power plants.

But for the first time he introduced commercial devices with so-called neutron tubes, which only generate neutrons when an operating voltage is applied. This source can thus be switched off. It consists of reservoirs of deuterium and tritium. From these reservoirs, deuterium and tritium atoms are accelerated against each other with a high voltage and collide. In addition to helium, neutrons are also produced. The older, classic technology uses the radioactive isotope Cf-252, which continuously releases neutrons. The neutron flux of the neutron tube is kept constant with an electronic control, while the active emitter constantly loses activity over its half-life. The neutron tube also has a significantly lower radiotoxicity class than the permanent emitter.

Another feature of the neutron tube is the pulsed excitation. Here neutrons are released in a short pulse and interact with the material. As a result, the gamma radiation of the different processes (scattering, prompt and delayed radiation) can be recorded in a time-resolved manner and used in an optimized manner. This technique allows the determination of very light elements such as oxygen or carbon.

Near infrared (NIR)

Under the product names "Fieldspec", "Labspec" and "Terraspec", PANalytical sells transportable measuring devices for near infrared spectroscopy (NIR spectroscopy) through ASD Inc. , with which, among other things, the moisture, fat and protein content of a material can be examined. Typical areas of application are raw material analysis, the examination of pharmaceutical products and the inspection of foodstuffs. It can also be used to determine mineral types of rocks. Spectrometers specially designed for this application area form the core markets of ASD: Remote sensing as well as exploration and production in the mining sector.

Web links

• Homepage on panalytical.de

Individual evidence

1. ↑ PANalytical - celebrating over 50 years of innovation in analytical X-ray . In: Journal of Applied Crystallography . tape 37 , no. 6 , November 11, 2004, p. 1039 , doi : 10.1107 / S0021889804024331 (PANalytical press release).
2. ^ Accent Optical Technologies to Acquire Philips Analytical's Waterloo, Canada Operations . In: Compound Semiconductors Online .