Franz Josef Giessibl

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Franz Josef Gießibl (born May 27, 1962 in Amerang ) is a German physicist and university professor at the University of Regensburg .

Life

Gießibl studied physics from 1982 to 1987 at the Technical University of Munich and at the Swiss Federal Institute of Technology in Zurich . In 1988 he graduated from the Technical University of Munich with Professor Gerhard Abstreiter with a thesis on experimental semiconductor physics. The doctorate took place in 1991 with Nobel Prize winner Gerd Binnig at the University of Munich on low-temperature atomic force microscopy . After completing his doctorate at Park Scientific Instruments in Silicon Valley, Sunnyvale, USA, he developed the first atomic force microscope that could atomically resolve reactive surfaces such as silicon. He then worked as a senior associate at the management consultancy firm McKinsey from 1995 to 1996. In his spare time he invented the qPlus sensor, a probe for atomic force microscopy. He then turned back to research on atomic force microscopy with Professor Jochen Mannhart at the University of Augsburg and received his habilitation in 2001 .

In 2006 he received a call to a Department of Applied and Experimental Physics at the University of Regensburg , which he accepted. From 2005 to 2010 he spent several research stays at the IBM Research Laboratory in Almaden, California. From fall 2015 to spring 2016 he was visiting professor at NIST in Gaithersburg, Maryland, USA and at the University of Maryland in College Park.

Gießibl is married to a primary school teacher and has two sons.

Scientific contributions

Gießibl has been working with atomic force microscopy since he began his doctorate in 1988 , has continuously improved it and has written fundamental experimental, instrumentation- related and theoretical papers on atomic force microscopy.

One example is the qPlus sensor. This sensor, which was originally based on a quartz tuning fork, is about a factor of 100 stiffer than conventional silicon force detectors and can therefore vibrate stably with small amplitudes of fractions of an atomic diameter even in contact with a surface. The qPlus sensor is used today in many commercial and self-made atomic force microscopes and has made it possible, for example, to achieve subatomic spatial resolution on individual atoms and submolecular resolution on organic molecules.

Awards

Web links

Lectures (selection)

Interviews (selection)

To Gießibl

Individual evidence

  1. ^ US Department of Commerce, NIST: Franz Giessibl. In: nist.gov. Retrieved April 10, 2016 .
  2. ↑ Nanophysicist Franz Gießibl handles oranges . In: The world . January 23, 2003 ( welt.de [accessed January 29, 2020]).
  3. ^ Spiegel Online - July 27, 2000: Science Nanophysics: Atoms under the microscope.
  4. ↑ The world. January 24, 2003: Nanophysicist Franz Giessibl is handling oranges.
  5. ^ The New York Times. February 22, 2008: Scientists Measure What It Takes to Push a Single Atom.
  6. ↑ FJ Giessibl: Atomic Resolution of the Silicon (111) - (7x7) Surface by Atomic Force Microscopy . In: Science . tape 267 , no. 5194 , 1995, pp. 68-71 , doi : 10.1126 / science.267.5194.68 , PMID 17840059 .
  7. ↑ a b F. J. Giessibl, p Hembacher, H. Bielefeldt, J. Mannhart: Subatomic features on the silicon (111) - (7x7) Surface Observed by Atomic Force Microscopy . In: Science . tape 289 , no. 5478 , 2000, pp. 422-426 , PMID 10903196 ( science.sciencemag.org ).
  8. ↑ FJ Giessibl, F. Pielmeier, T. Eguchi, T. An, Y. Hasegawa: A comparsion of force sensors for atomic force microscopy based on quartz tuning forks and length extensional resonators . In: Physical Review B . tape 84 , no. 12 , 2011, ISSN  1098-0121 , doi : 10.1103 / PhysRevB.84.125409 , arxiv : 1104.2987 (15 pages).
  9. ↑ FJ Giessibl: Forces and frequency shifts in atomic-resolution dynamic-force microscopy . In: Physical Review B . tape 56 , no. 24 , 1997, pp. 16010-16015 , doi : 10.1103 / PhysRevB.56.16010 .
  10. ↑ FJ Giessibl: Advances in atomic force microscopy . In: Reviews of Modern Physics . tape 75 , no. 3 , 2003, ISSN  0034-6861 , p. 949-983 , doi : 10.1103 / RevModPhys.75.949 , arxiv : cond-mat / 0305119 .
  11. ↑ FJ Giessibl: Device for noncontact intermittent contact scanning of a surface and a process THEREFORE. US patent 6240771.
  12. ↑ FJ Giessibl: Sensor for noncontact profiling of a surface. U.S. Patent 8393009.
  13. ↑ CreaTec Fischer & Co. GmbH ( createc.de ).
  14. ↑ Low Temperature SPM - Scienta Omicron. ( scientaomicron.com ).
  15. ^ M. Emmrich, et al .: Subatomic resolution force microscopy reveals internal structure and adsorption sites of small iron clusters . In: Science . tape 348 , no. 6232 , 2015, p. 308-311 , here p. 308 , doi : 10.1126 / science.aaa5329 , PMID 25791086 .
  16. ^ L. Gross et al .: The chemical structure of a molecule resolved by atomic force microscopy . In: Science . tape 325 , no. 5944 , 2009, p. 1110–1114 , here p. 1110 , doi : 10.1126 / science.1176210 , PMID 19713523 .
  17. ^ Rudolf Jaeckel Prize 2015 to Prof. Dr. Franz J. Giessibl . In: Vacuum in research and practice . tape 27 , no. 5 , 2015, ISSN  0947-076X , p. 38-38 , doi : 10.1002 / vipr.201590050 .
personal data
SURNAME Giessibl, Franz Josef
BRIEF DESCRIPTION German physicist
DATE OF BIRTH May 27, 1962
PLACE OF BIRTH Amerang