JEOL

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JEOL Ltd.

logo
legal form Kabushiki kaisha (joint stock company)
ISIN JP3735000006
founding 1949
Seat Akishima , Tokyo Prefecture , Japan
management
Number of employees 2,976 (03/2017)
sales ¥ 99.7 billion (03/2017)
Branch Electron optics , molecular analysis , semiconductor technology , medical technology
Website www.jeol.com , www.jeol.jp , www.jeol.de , www.jeol.at , www.jeol.ch

The Nihon Denshi KK ( Jap. 日本電子株式会社 , Nihon (dt Japan) Denshi (dt electron).. Kabushiki Kaisha ; Engl. JEOL Ltd. ) is one of the world's largest manufacturer of electronic optical devices. The name is an acronym and stands for Japan Electron Optics Laboratory.

JEOL has 26 subsidiaries and affiliates in Japan and other countries. A wide range of products is developed and manufactured at the headquarters in Akishima, Tokyo: from systems for semiconductor technology , molecular analysis ( NMR , ESR , mass spectrometer ) and medical technology (blood and amino acid analyzers ) to high-performance accumulators and capacitors .

Fields of activity

JEOL primarily manufactures electron optical devices. These include electron microscopes ( SEM / TEM ), energy / wavelength dispersive element analyzers ( EDX / WDX ), electron beam microprobes ( EPMA ), scanning Auger probes , X-ray fluorescence spectrometers ( RFA ), scanning probe microscopes ( SPM / STM / AFM ), " Focused Ion Beam " Systems (short: FIB) and sample preparation systems for SEM and TEM. In addition, a combined light and scanning electron microscope is produced under the ClairScope name.

The Analytical Instruments division offers nuclear spin resonance spectrometers ( NMR ), electron spin spectrometers ( ESR ) and mass spectrometers . Also a flow cell for in situ reaction monitoring in NMR (MICCS = Micro Channeled Cell for Synthesis monitoring).

The devices of the two areas are used equally in scientific and industrial applications.

Two other business areas are equipment systems for the semiconductor industry and research as well as medical technology . Electron beam lithography systems and systems for wafer and mask inspection are therefore just as much a part of the product range as clinical diagnostic systems and automated blood and amino acid analyzers.

Against the background of ecological efforts, JEOL developed a replacement for CFC- containing industrial washing solutions. This "super-reducing water" is produced for the Japanese market under the name RUMIC. It is also available there for private use.

Since 2008, JEOL has also been represented in the field of high-capacity capacitors with the product Premlis.

JEOL devices are used by researchers around the world, for example at the University of Oxford and the Fraunhofer Institute for Material and Beam Technology IWS in Dresden.

history

JEM-200A transmission electron microscope from the 1970s

Japanese scientists were working on the development of an electron microscope as early as 1939. Kenji Kazato and Kazuo Ito met during the Second World War at the Central Shipping Institute in Tokyo. After the war, Kazato formed a research group with Ito and others in Mobara , where they developed the prototype of the transmission electron microscope DA-1 before the company was founded. This was completed in 1947 and delivered to Mitsubishi Chemical Industry. Because of differences over the management of this early company, the group left Mobara and Kazato and Ito decided to form a new company in Mitaka, Tokyo. In 1949, the two founded the KK Nihon Denshi Kōgaku Kenkyūjo (株式会社 日本 電子 光学 研究所 - English name: Japan Electron Optics Laboratory Co., Ltd. or abbreviation JEOL).

In 1949, production and sales of the commercial electron microscope began under the name JEM-1. The first delivery of a JEM model outside of Japan was in 1956 to the Research Institute of the French Commissioner's Office for Nuclear Energy ( CEA ) in Saclay. In the same year, the German inventor of the electron microscope and later Nobel Prize winner, Ernst Ruska , visited JEOL in Japan.

Also in 1956, JEOL created the first Japanese NMR spectrometer . In the period that followed, further devices were developed for electron beam microanalysis (1962), mass spectrometry (1963), electron beam lithography (1967), fully automatic analysis of amino acids (1969) and biochemical analysis (1972). Two years later, the raster Auger probe was added. In 1980 the two Nobel Prize winners Linus Pauling and Alexander Prokhorov visited the company. They were followed eight years later by the Swedish award winner Kai Siegbahn .

In 1961 the company name was changed to Nihon Denshi Co., Ltd. changed, but the original English name JEOL was retained. In 1962, JEOL was listed on the Tokyo Stock Exchange . In the same year the first foreign subsidiary was established - JEOL (USA) INC. Others were founded in France in 1964 and in Great Britain and Australia in 1968. Today JEOL is represented in more than 30 countries worldwide.

In 1990, JEOL introduced a system for inspecting wafers . This was a custom-made product for the rapidly developing semiconductor industry. At that time it mainly comprised chip manufacturers and is now a complex market in which the solar industry plays an important role.

In 2014, the atomic resolution transmission electron microscope JEM-ARM300F demonstrated an STEM resolution of 45 pm with a 300 kV microscope for the first time.

subsidiary company

JEOL (Germany) in Freising

In addition to JEOL Technics LTD. there are thirteen branches and five subsidiaries in Japan. There are also subsidiaries in 19 other countries: USA, France, England (UK), Australia, Netherlands / Belgium, Sweden, Germany, Italy, Mexico, Canada, Korea, Singapore, Malaysia, Taiwan, China, Brazil, Russia, India and in the United Arab Emirates. The five European agencies form a European network for sales, training, application and service. Their territorial jurisdiction is structured as follows:

  • JEOL (Europe) BV - Belgium, Luxembourg, Netherlands
  • JEOL (Germany) GmbH - Germany, Austria, Switzerland, Liechtenstein, Denmark, Greenland, Estonia, Latvia, Lithuania
  • JEOL (Europe) SAS - France, Albania, Algeria, Bulgaria, Cyprus, Morocco, Romania, Tunisia; and as an alternative contact for the Czech Republic, Greece, Poland, Portugal, Slovakia, Spain, Turkey
  • JEOL (UK) LTD. - Great Britain, Ireland, Malta; as well as an alternative contact for Israel and South Africa
  • JEOL (Nordic) AB - Sweden, Norway, Finland, Iceland

The youngest of these daughters is JEOL (Germany) GmbH. It was founded in 1997 and replaced Kontron Elektronik as a representative of JEOL in the D / CH / FL area. The Scandinavian JEOL (Nordic) AB has been a subsidiary of the German branch since 2010.

social commitment

In 1969 the Kazato Research Foundation was established. The foundation supports the development of and research with electron microscopes and young researchers with various programs. In this context, the "Science Camp" for children and young people has been offered since 2004 and since 2007 there has also been "Science Class Support" at several Japanese primary schools.

Many JEOL employees are committed to environmental protection with regular clean-up activities in the vicinity of the Akishima plant. So far, more than 100 such actions have taken place.

Certifications

At the beginning of the 1980s, certification was issued for 2.5 million accident-free working hours. JEOL has been certified according to ISO 9001 as part of quality management since 1995, and according to ISO 14001 since 2002 as part of environmental management .

Trivia

A mass spectrometer system from JEOL with DART ( Direct Analysis in Real Time ) was already shown in the TV series CSI: New York .

Individual evidence

  1. a b c d e f JEOL 2017 Annual Report
  2. ^ Instruments , Oxford University. David Cockayne Center for Electron Microscopy David Cockayne Center for Electron Microscopy. Dined on April 20, 2018.
  3. Equipment, analytical transmission electron microscope , Fraunhofer IWS. Dined on April 20, 2018.
  4. jeol.co.jp: Milestones
  5. ^ Resolving 45-pm-separated Si – Si atomic columns with an aberration-corrected STEM
  6. OL KRIVANEK, TC LOVEJOY, N. DELLBY: Aberration-corrected STEM for atomic-resolution imaging and analysis. In: Journal of Microscopy. 259, 2015, p. 165, doi: 10.1111 / jmi.12254 .
  7. Kazato Research Foundation Visited April 20, 2018.
  8. Salem News Online ( Memento of the original from May 26, 2011 in the Internet Archive ) Info: The archive link was inserted automatically and has not yet been checked. Please check the original and archive link according to the instructions and then remove this notice. @1@ 2Template: Webachiv / IABot / www.ecnnews.com